Electrically screened to DLA SMD# 5962-13214 Acceptance tested to 50krad(Si) (LDR) wafer-by-wafer <5µs recovery from SEE (LETTH = 86.4MeV•cm2/mg
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ISL70444SEHVXRenesasElectrically screened to DLA SMD# 5962-13214 Acceptance tested to 50krad(Si) (LDR) wafer-by-wafer <5µs recovery from SEE (LETTH = 86.4MeV•cm2/mg